XTOP 2026 brings together scientists working in X-ray diffractometry and reflectometry, coherent and conventional X-ray diffraction imaging and topography, as well as 2D and 3D X-ray imaging using phase contrast and complementary contrast mechanisms. The conference is a leading forum for laboratory- and synchrotron-based methods, instrumentation, and applications.

Important dates:

• Opening date for submission of abstracts: 31 March 2026
• Deadline for submission of abstracts: 11 May 2026
• Early-bird registration deadline: 14 June 2026
• Deadline for late registration: 20 August 2026